Development and Production of Array Barrier Detectors at SCD

Klipstein, PC; Avnon, E; Benny, Y; Berkowicz, E; Cohen, Y; Dobromislin, R; Fraenkel, R; Gershon, G; Glozman, A; Hojman, E; Ilan, E; Karni, Y; Klin, O; Kodriano, Y; Krasovitsky, L; Langof, L; Lukomsky, I; Nevo, I; Nitzani, M; Pivnik, I; Rappaport, N;

Klipstein, PC (reprint author), Semicond Devices, POB 2250, IL-31021 Haifa, Israel.

JOURNAL OF ELECTRONIC MATERIALS, 2017; 46 (9): 5386