Atomic Force Microscopy (AFM) Analysis of an Object Larger and Sharper than the AFM Tip

Chen, Z; Luo, JW; Doudevski, I; Erten, S; Kim, SH

Kim, SH (reprint author), Penn State Univ, Dept Chem Engn, University Pk, PA 16802 USA.; Kim, SH (reprint author), Penn State Univ, Mat Res Inst, University Pk, PA 16802 USA.

MICROSCOPY AND MICROANALYSIS, 2019; 25 (5): 1106

Abstract

Atomic force microscopy (AFM) is typically used for analysis of relatively flat surfaces with topographic features smaller than the height of the AFM ......

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