Degradation of AlGaN-based metal-semiconductor-metal photodetectors

Brendel, M; Hagedorn, S; Brunner, F; Reiner, M; Zeimer, U; Weyers, M

Brendel, M (reprint author), Leibniz Inst Hochstfrequenztech FBH, Ferdinand Braun Inst, Gustav Kirchhoff Str 4, D-12489 Berlin, Germany.

JAPANESE JOURNAL OF APPLIED PHYSICS, 2019; 58 ():

Abstract

The degradation of AlGaN-based metal-semiconductor-metal photodetectors under UV illumination has been studied. Oxidation triggered by the presence of......

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