On-Chip ESD Monitor

Kannan, KT; Vaisband, B; Iyer, SS

Kannan, KT (reprint author), Univ Calif Los Angeles, Dept Elect & Comp Engn, Ctr Heterogenous Integraton & Performance Scaling, Los Angeles, CA 90025 USA.

2019 IEEE 69TH ELECTRONIC COMPONENTS AND TECHNOLOGY CONFERENCE (ECTC), 2019; (): 2225

Abstract

Electrostatic discharge (ESD) failure results in about 35% of IC field returns, and is the cause of several billion-dollar loss to the semiconductor i......

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