An edge-on energy-resolved X-ray semiconductor detector

Yan, TF; Yang, CL; Cui, XD

Yan, TF (corresponding author), China Acad Engn Phys, Grad Sch, Beijing 100088, Peoples R China.; Cui, XD (corresponding author), Univ Hong Kong, Dept Phys, Hong Kong 999077, Peoples R China.

SOLID STATE COMMUNICATIONS, 2021; 332 ():

Abstract

The hyperspectral X-ray imaging has long been sought in various fields from material analysis to medical diagnosis. Here we propose a semiconductor de......

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