Isolation properties and failure mechanisms of vertical Pt / n-GaN SBDs-MedSci.cn

Isolation properties and failure mechanisms of vertical Pt / n-GaN SBDs

Fregolent, M; Boito, M; Marcuzzi, A; De Santi, C; Chiocchetta, F; Treidel, EB; Wolf, M; Brunner, F; Hilt, O; Wurfl, J; Meneghesso, G; Zanoni, E; Meneghini, M

Fregolent, M (通讯作者)，Univ Padua, Dept Informat Engn, I-35131 Padua, Italy.

MICROELECTRONICS RELIABILITY, 2022; 138 ():

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