XPS investigation of the ALD Al2O3/HgCdTe heterointerface

Zakirov, ER; Kesler, VG; Sidorov, GY; Prosvirin, IP; Gutakovsky, AK; Vdovin, VI

Zakirov, ER (reprint author), Russian Acad Sci, Rzhanov Inst Semicond Phys, Siberian Branch, Pr Lavrentieva 13, Novosibirsk 630090, Russia.

SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 2019; 34 (6):