High Mass Resolution Multireflection Time-of-Flight Secondary Ion Mass Spectrometer

Jiang, JC; Hua, L; Xie, YY; Cao, YX; Wen, YX; Chen, P; Li, HY

Chen, P; Li, HY (corresponding author), Chinese Acad Sci, Dalian Inst Chem Phys, Key Lab Separat Sci Analyt Chem, Dalian 116023, Liaoning, Peoples R China.

JOURNAL OF THE AMERICAN SOCIETY FOR MASS SPECTROMETRY, 2021; 32 (5): 1196

Abstract

Time-of-flight secondary ion mass spectrometry (TOF-SIMS) is popular because of its advantages of parallel m/z detection and less damage for unknown o......

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