Short-Circuit Degradation of 10-kV 10-A SiC MOSFET

Eni, EP; Beczkowski, S; Munk-Nielsen, S; Kerekes, T; Teodorescu, R; Juluri, RR; Julsgaard, B; VanBrunt, E; Hull, B; Sabri, S; Grider, D; Uhrenfeldt, C

Eni, EP (reprint author), Aalborg Univ, Dept Energy Technol, DK-9220 Aalborg, Denmark.

IEEE TRANSACTIONS ON POWER ELECTRONICS, 2017; 32 (12): 9342