Study on the Pulse Phase Lag Effect on Two Mask Holes During Plasma Etching

Zhang, P

Zhang, P (corresponding author), Yangtze Normal Univ, Sch Elect Informat Engn, Chongqing 408100, Peoples R China.

BRAZILIAN JOURNAL OF PHYSICS, 2021; 51 (4): 1117

Abstract

The charging effect seriously limits the quality of the pattern transfer from a mask onto the etched material in the plasma etching. This work investi......

Full Text Link