Pulse length, energy spread, and temporal evolution of electron pulses generated with an ultrafast beam blanker

Weppelman, IGC; Moerland, RJ; Zhang, L; Kieft, E; Kruit, P; Hoogenboom, JP

Hoogenboom, JP (reprint author), Delft Univ Technol, Imaging Phys, Lorentzweg 1, NL-2628 CJ Delft, Netherlands.

STRUCTURAL DYNAMICS-US, 2019; 6 (2):

Abstract

Crucial for the field of ultrafast electron microscopy is the creation of sub-picosecond, high brightness electron pulses. The use of a blanker to cho......

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