A Highly Reliable RRAM Physically Unclonable Function Utilizing Post-Process Randomness Source

Lin, BH; Pang, YC; Gao, B; Tang, JS; Wu, D; Chang, TW; Lin, WE; Sun, XY; Yu, SM; Chang, MF; Qian, H; Wu, HQ

Wu, HQ (corresponding author), Tsinghua Univ, Beijing Innovat Ctr Future Chips ICFC, Inst Microelect, Beijing 100084, Peoples R China.

IEEE JOURNAL OF SOLID-STATE CIRCUITS, 2021; 56 (5): 1641

Abstract

Physically unclonable function (PUF) has been increasingly used as a promising primitive for hardware security with a wide range of applications in th......

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