Toward traceable XCT measurement of AM lattice structures: Uncertainty in calibrated reference object measurement-MedSci.cn

Toward traceable XCT measurement of AM lattice structures: Uncertainty in calibrated reference object measurement

Praniewicz, M; Fox, JC; Saldana, C

Praniewicz, M (通讯作者)，Natl Inst Stand & Technol, Gaithersburg, MD 20899 USA.

PRECISION ENGINEERING-JOURNAL OF THE INTERNATIONAL SOCIETIES FOR PRECISION ENGINEERING AND NANOTECHNOLOGY, 2022; 77 (): 194

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