DN-ResNet: Efficient Deep Residual Network for Image Denoising

Ren, HY; El-Khamy, M; Lee, J

Ren, HY (reprint author), Samsung Semicond Inc, SOC R&D, 9868 Scranton Rd, San Diego, CA 92121 USA.

COMPUTER VISION - ACCV 2018, PT V, 2019; 11365 (): 215

Abstract

A deep learning approach to blind denoising of images without complete knowledge of the noise statistics is considered. We propose DN-ResNet, which is......

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