Spatial DIC Errors due to Pattern-Induced Bias and Grey Level Discretization (November, 10.1007/S11340-019-00553-9, 2019)

Fayad, SS; Seidl, DT; Reu, PL

Fayad, SS (corresponding author), Sandia Natl Labs, POB 5800, Albuquerque, NM 87185 USA.

EXPERIMENTAL MECHANICS, 2020; 60 (4): 573