Impact of Terrestrial Neutrons on the Reliability of SiC VD-MOSFET Technologies

Martinella, C; Alia, RG; Stark, R; Coronetti, A; Cazzaniga, C; Kastriotou, M; Kadi, Y; Gaillard, R; Grossner, U; Javanainen, A

Martinella, C (corresponding author), Univ Jyvaskyla, Dept Phys, Jyvaskyla 40014, Finland.

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2021; 68 (5): 634

Abstract

Accelerated terrestrial neutron irradiations were performed on different commercial SiC power MOSFETs with planar, trench, and double-trench architect......

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