Scanning DMA data analysis II. Integrated DMA-CPC instrument response and data inversion

Mai, HJ; Kong, WM; Seinfeld, JH; Flagan, RC

Flagan, RC (reprint author), CALTECH, Pasadena, CA 91125 USA.

AEROSOL SCIENCE AND TECHNOLOGY, 2018; 52 (12): 1400

Abstract

Analysis of scanning electrical mobility spectrometer (SEMS) or SMPS data requires coupling the scanning differential mobility analyzer (DMA) transfer......

Full Text Link