Traveling Wave Excitation for WM Simulation of RF SAW/BAW Devices

Li, XY; Bao, JF; Huang, YL; Zhang, BF; Omori, T; Hashimoto, K

Li, XY (reprint author), Univ Elect Sci & Technol China, Sch Elect Engn, Chengdu 611731, Sichuan, Peoples R China.; Li, XY (reprint author), Chiba Univ, Grad Sch Engn, Inage Ku, Chiba 2638522, Japan.

2017 IEEE INTERNATIONAL ULTRASONICS SYMPOSIUM (IUS), 2017; ( ):

Abstract

This paper proposes use of traveling wave type excitation sources for the scattering analysis of RF SAW/BAW devices using the finite element method (F......

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