Deep Adversarial Data Augmentation for Fabric Defect Classification With Scarce Defect Data-MedSci.cn

Deep Adversarial Data Augmentation for Fabric Defect Classification With Scarce Defect Data

Lu, BY; Zhang, M; Huang, BQ

Huang, BQ (通讯作者)，Tsinghua Univ, Beijing Natl Res Ctr Informat Sci & Technol, Beijing 100084, Peoples R China.;Huang, BQ (通讯作者)，Tsinghua Univ, Dept Automat, Beijing 100084, Peoples R China.

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2022; 71 ():

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