iDO: Compiler-Directed Failure Atomicity for Nonvolatile Memory

Liu, QR; Izraelevitz, J; Lee, SK; Scott, ML; Noh, SH; Jung, C

Liu, QR (reprint author), Virginia Tech, Blacksburg, VA 24061 USA.

2018 51ST ANNUAL IEEE/ACM INTERNATIONAL SYMPOSIUM ON MICROARCHITECTURE (MICRO), 2018; (): 258