Influence of External Gate Resistance on UIS Capability in Superjunction MOSFET

Honda, M; Yamaji, M; Arai, D; Suzuki, N; Asada, T; Hirasawa, W; Yamaguchi, T; Watanabe, Y

Honda, M (reprint author), Shindengen Elect Mfg Co Ltd, Elect Device Div, 10-13 Minami Cho, Hanno, Saitama, Japan.

2019 31ST INTERNATIONAL SYMPOSIUM ON POWER SEMICONDUCTOR DEVICES AND ICS (ISPSD), 2019; (): 335

Abstract

We investigated the UIS capability for superjunction MOSFETs with respect to the external gate resistance (R-g) and the charge imbalance (CIB) by expe......

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