High-precision CD measurement using energy-filtering SEM techniques

Bizen, D; Sakakibara, M; Suzuki, M; Momonoi, Y; Kawano, H

Bizen, D (reprint author), Hitachi Ltd, Kokubunji, Tokyo, Japan.

JOURNAL OF MICRO-NANOLITHOGRAPHY MEMS AND MOEMS, 2017; 16 (2):

Abstract

Voltage contrast (VC) images obtained using an energy filter (EF) were used to measure the bottom surface of high-aspect-ratio structures. The VC imag......

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