EBSD-assisted Laue microdiffraction for microstrain analysis

Ors, T; Micha, JS; Gey, N; Michel, V; Castelnau, O; Guinebretiere, R

Ors, T (reprint author), CNRS, ENSAM, CNAM, PIMM,UMR 8006, 151 Blvd Hop, F-75013 Paris, France.; Ors, T (reprint author), Univ Lorraine, CNRS, LEM3, UMR 7239, 7 Rue Felix Savart, F-57045 Metz 1, France.; Guinebretiere, R (reprint author), Univ Limoges, SP

JOURNAL OF APPLIED CRYSTALLOGRAPHY, 2018; 51 (): 55

Abstract

The X-ray Laue microdiffraction (mu Laue) technique has been establishing itself as a reliable means for microstrain analysis for the past few decades......

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