Defect-Assisted Tunneling Electroresistance in Ferroelectric Tunnel Junctions

Klyukin, K; Tao, LL; Tsymbal, EY; Alexandrov, V

Alexandrov, V (reprint author), Univ Nebraska, Dept Chem & Biomol Engn, Lincoln, NE 68588 USA.; Tsymbal, EY (reprint author), Univ Nebraska, Dept Phys & Astron, Lincoln, NE 68588 USA.; Tsymbal, EY; Alexandrov, V (reprint author), Univ Nebraska, Nebraska C

PHYSICAL REVIEW LETTERS, 2018; 121 (5):

Abstract

Recent experimental results have demonstrated ferroelectricity in thin films of SrTiO3 induced by antisite TiSr defects. This opens a possibility to u......

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