Interface induced diffusion

Gurban, S; Sulyok, A; Menyhard, M; Baradacs, E; Parditka, B; Cserhati, C; Langer, GA; Erdelyi, Z

Menyhard, M (corresponding author), Ctr Energy Res, Inst Tech Phys & Mat Sci, Thin Film Dept, POB 49, H-1525 Budapest, Hungary.

SCIENTIFIC REPORTS, 2021; 11 (1):

Abstract

Interface induced diffusion had been identified in a thin film system damaged by electron bombardment. This new phenomenon was observed in Al2O3 (some......

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