Processing and analysis of X-ray photoelectron diffraction data using IGOR Pro

Liang, XH; Lubin, C; Mathieu, C; Barrett, N

Liang, XH; Barrett, N (reprint author), CEA, IRAMIS, SPEC, LENSIS, F-91191 Gif Sur Yvette, France.; Liang, XH (reprint author), Guangzhou Res Inst Optomechanoelect Technol, 3 Keyan Rd, Guangzhou 510663, Guangdong, Peoples R China.

JOURNAL OF APPLIED CRYSTALLOGRAPHY, 2018; 51 (): 935

Abstract

A software package is presented for nearly real-time display of diffractograms during X-ray photoelectron diffraction (XPD) data acquisition and for p......

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